![]() This work is supposed to provide a convenient and accurate method for the characterization of nanomaterials with low-dimensional morphology through TEM. Ideal tool for performing high precision magnification calibration. Automatically tracks all measurements in different images and provides output which can be easily exported to any word processor or plotting applications. TEM combining with the SAED is favorable compare with XRD, which not only provides more accurate aspect ratio results with standard deviation values but also requires very small amounts of sample. Provides simple and accurate measurements of lattice spacings and the angle between two sets of lattice planes. The 7.36 ± 0.20 and 0.39 ± 0.02 aspect ratio (c/a) of ZnO nanorods and nanosheets could be obtained through the integration of the (100) and (002) diffraction rings in selected area electron diffraction (SAED). The results indicate that ZnO nanorods and nanosheets display rod-like and orthohexagnal morphology, which mainly encapsulated with planes, respectively. Herein, ZnO nanorod and nanosheet featured with one- and two-dimensional morphology were selected as model materials, which were prepared by the hydrothermal method and statistically characterized by transmission electron microscopy (TEM). However, the widely adopted techniques such as XRD is incapable to precise identify the aspect ratio of low-dimensional nanomaterials, not even to quantify the morphological uniformity with statistical deviation value. Thus, accurate identification of the structure and morphology is the basis to correlate to the performance. Nanomaterials with low-dimensional morphology display unique properties in catalysis and related fields, which are highly dependent on the structure and aspect ratio. ![]()
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